{"id":3823,"date":"2017-03-03T13:10:15","date_gmt":"2017-03-03T21:10:15","guid":{"rendered":"https:\/\/blogs.ubc.ca\/karthik\/?p=3823"},"modified":"2022-11-24T12:43:58","modified_gmt":"2022-11-24T19:43:58","slug":"one-bit-is-not-enough-an-empirical-study-of-the-impact-of-single-and-multiple-bit-flip-errors","status":"publish","type":"post","link":"https:\/\/blogs.ubc.ca\/dependablesystemslab\/2017\/03\/03\/one-bit-is-not-enough-an-empirical-study-of-the-impact-of-single-and-multiple-bit-flip-errors\/","title":{"rendered":"One Bit is (Not) Enough: An Empirical Study of the Impact of Single and Multiple Bit-Flip Errors"},"content":{"rendered":"<p>Behrooz Sangchoolie, Karthik Pattabiraman, and Johan Karlsson, <a href=\"http:\/\/dsn2017.github.io\/\">IEEE\/IFIP International Conference on Dependable Systems and Networks (DSN), 2017<\/a>. (Acceptance Rate: 23%). [ <a href=\"https:\/\/blogs.ubc.ca\/karthik\/files\/2017\/04\/DSN17-Behrooz.pdf\">PDF<\/a> | <a href=\"https:\/\/blogs.ubc.ca\/karthik\/files\/2017\/06\/DSN17-Karthik-Behrooz.pdf\">Talk<\/a> ]<\/p>\n<p><!--more--><br \/>\n<strong>Abstract<\/strong>: Recent studies have shown that technology and voltage scaling are expected to increase the likelihood that particle-induced soft errors manifest as multiple-bit errors. This raises concerns about the validity of using single bit-flips for assessing the impact of soft errors in fault injection experiments. The goal of this paper is to investigate whether multiple-bit errors could cause a higher percentage of silent data corruptions (SDCs) compared to single-bit errors. Based on 2700 fault injection campaigns with 15 benchmark programs, featuring a total of 27 million experiments, our results show that single-bit errors in most cases yields a higher percentage of SDCs compared to multiple-bit errors. However, in 8% of the campaigns we observed a higher percentage of SDCs for multiple-bit errors. For most of these campaigns, the highest percentage of SDCs was obtained by flipping at most 3 bits. Moreover, we propose three ways of pruning the error space based on the results.<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Behrooz Sangchoolie, Karthik Pattabiraman, and Johan Karlsson, IEEE\/IFIP International Conference on Dependable Systems and Networks (DSN), 2017. (Acceptance Rate: 23%). [ PDF | Talk ]<\/p>\n","protected":false},"author":10348,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[5],"tags":[2,3,4,6,7],"class_list":["post-3823","post","type-post","status-publish","format-standard","hentry","category-publications","tag-2","tag-behrooz","tag-conference","tag-reliability","tag-many-core"],"_links":{"self":[{"href":"https:\/\/blogs.ubc.ca\/dependablesystemslab\/wp-json\/wp\/v2\/posts\/3823","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/blogs.ubc.ca\/dependablesystemslab\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/blogs.ubc.ca\/dependablesystemslab\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/blogs.ubc.ca\/dependablesystemslab\/wp-json\/wp\/v2\/users\/10348"}],"replies":[{"embeddable":true,"href":"https:\/\/blogs.ubc.ca\/dependablesystemslab\/wp-json\/wp\/v2\/comments?post=3823"}],"version-history":[{"count":1,"href":"https:\/\/blogs.ubc.ca\/dependablesystemslab\/wp-json\/wp\/v2\/posts\/3823\/revisions"}],"predecessor-version":[{"id":5622,"href":"https:\/\/blogs.ubc.ca\/dependablesystemslab\/wp-json\/wp\/v2\/posts\/3823\/revisions\/5622"}],"wp:attachment":[{"href":"https:\/\/blogs.ubc.ca\/dependablesystemslab\/wp-json\/wp\/v2\/media?parent=3823"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/blogs.ubc.ca\/dependablesystemslab\/wp-json\/wp\/v2\/categories?post=3823"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/blogs.ubc.ca\/dependablesystemslab\/wp-json\/wp\/v2\/tags?post=3823"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}