Old Papers (before 2010)

For a list of papers published since 2010, please go here.

Journals Conferences Workshops Patents Tech Reports

Journals:

  1. Toward Application-aware Security and Reliability, Ravishankar Iyer, Zbigniew Kalbarczyk, Karthik Pattabiraman, Wen-Mei Hwu, William Healey, Peter Klemperer and Reza Farivar, IEEE Security and Privacy (S&P) Magazine, Jan 2007 (invited).

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Refereed Conferences (Acceptance rates given where known): In the dependable systems area, conferences are the preferred venue for dissemination. All papers are subject to peer reviews.

  1. An End-to-end Approach for the Automatic Derivation of Application-aware Error Detectors, Galen Lyle, Shelley Chen, Karthik Pattabiraman, Zbigniew Kalbarczyk and Ravishankar Iyer, Proceedings of the International Conference on Dependable Systems and Networks (DSN) , Estoril, Portugal, 2009. (Acceptance rate: 25 %)

  2. Discovering Application-level Insider attacks using Symbolic Execution, Karthik Pattabiraman, Nithin Nakka, Zbigniew Kalbarczyk and Ravishankar Iyer, Proceedings of the IFIP 24th International Information Security Conference (SEC), 2009, Cyprus. (Acceptance Rate: 22 %)

  3. ToleRace: Detecting and Tolerating Asymmetric Races, Paruj Ratanaworabhan, Martin Burtscher, Darko Kirovski, Benjamin Zorn, Karthik Pattabiraman and Rahul Nagpal, Proceedings of the ACM SIGPLAN Symposium on Principles and Practice of Parallel Programming (PPoPP), 2009, Salt Lake City, Utah. (Acceptance Rate: 24 %)

  4. SymPLFIED: Symbolic Program Level Fault-Injection and Error Detection Framework, Karthik Pattabiraman, Nithin Nakka, Zbigniew Kalbarczyk and Ravishankar Iyer, Proceedings of the IEEE International Conference on Dependable Systems and Networks (DSN), 2008, Anchorage, AK. (Acceptance Rate: 25 %). This paper received the William C. Carter award for best paper at the conference – one paper was chosen among a total of 236 submissions.

  5. Samurai: Protecting Critical Heap Data in Unsafe Languages, Karthik Pattabiraman, Vinod Grover and Benjamin Zorn, Proceedings of the ACM European Systems Conference (EuroSys), 2008, Glasgow, Scotland. (Acceptance Rate: 18 %)

  6. Automated Derivation of Application-Aware Error Detectors using Static Analysis, Karthik Pattabiraman, Zbigniew Kalbarczyk and Ravishankar Iyer, Proceedings of the IEEE International Online Test Symposium (IOLTS), 2007, Herkalion, Greece.

  7. Processor-level Selective Replication, Nithin Nakka, Karthik Pattabiraman and Ravishankar Iyer, Proceedings of the IEEE International Conference on Dependable Systems and Networks (DSN), 2007, Edinburgh, UK. (Acceptance Rate: 25 %)

  8. Dynamic Derivation of Application-Specific Error Detectors and their Hardware Implementation, Karthik Pattabiraman, Giacinto Paulo Saggesse, Daniel Chen, Zbigniew Kalbarczyk, Ravishankar Iyer, Proceedings of the European Dependable Computing Conference (EDCC), 2006, Coimbra, Portugal. (Acceptance Rate: 27 %)

  9. Application-Based Metrics for Strategic Placement of Detectors, Karthik Pattabiraman, Zbigniew Kalbarczyk and Ravishankar Iyer, Proceedings of the IEEE Symposium on Pacific Rim Dependable Computing (PRDC), 2005, Changsha city, China. (Acceptance Rate: 36.5 %)

  10. Modeling Coordinated Checkpointing for Large-Scale Supercomputers, Long Wang, Karthik Pattabiraman, Larry Votta, Chris Vick, Alan Wood, Zbigniew Kalbarczyk and Ravishankar Iyer, Proceedings of the IEEE International Conference on Dependable Systems and Networks (DSN), 2005, Yokohoma, Japan. (Acceptance Rate: 25 %)

  11. Formal Reasoning of Various Categories of Widely Exploited Security Vulnerabilities by Pointer Taintedness Semantics, Shuo Chen, Karthik Pattabiraman, Zbigniew Kalbarczyk and Ravishankar Iyer, Proceedings of the IFIP 19th International Information Security Conference (SEC), Toulose, France, 2004. (Acceptance Rate: 22 %)

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Refereed Workshops

  1. Hardware Implementation of Information Flow Signatures Derived via Program Analysis, Paul Dabrowski, William Healey, Karthik Pattabiraman, Shelley Chen, Zbigniew Kalbarczyk, Ravishankar Iyer, Workshop on Dependable and Secure Nano-computing (WDSN), 2008, Anchorage, AK.

  2. Critical Variable Recomputation for Transient Error Detection, Karthik Pattabiraman, Zbigniew Kalbarczyk and Ravishankar K. Iyer, Workshop on Silicon Errors in Logic, System Effects (SELSE), 2007, Austin, TX.

  3. FPGA Hardware Implementation of Statically Derived Application-aware Error Detectors, Peter Klemperer, Shelley Chen, Karthik Pattabiraman, Zbigniew Kalbarczyk and Ravishankar Iyer, Workshop on Dependable and Secure Nano-computing (WDSN), 2007, Edinburgh, UK.

  4. Tolerace: Tolerating and Detecting Asymmetric Races (Position Paper), Rahul Nagpal, Karthik Pattabiraman, Darko Kirovski, Benjamin Zorn, Workshop on Software Tools for Multi-core Systems (STMCS), 2007.

  5. Processor-level Selective Replication, Nithin Nakka, Karthik Pattabiraman, Zbigniew Kalbarczyk, Ravishankar Iyer, Workshop on Silicon Errors in Logic, System Effects (SELSE), 2006, Urbana, IL.

  6. Automated Derivation and Hardware Implementation of Application-Specific Error Detectors, Karthik Pattabiraman, Giacinto Paulo Saggesse, Daniel Chen, Zbigniew Kalbarczyk and Ravishankar Iyer, Workshop on Reliability Issues in High-Performance Computing (HPCRI), 2005, Austin, TX.

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Patents Filed

  1. Critical Memory, with Benjamin Zorn and Vinod Grover, Microsoft Corporation, December 2006, USA (Patent# 20080140957).

  2. Critical Memory using Replication, with Benjamin Zorn, Vinod Grover, Microsoft Corporation, December 2006, USA (Patent# 20080140962).

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Unpublished Technical Reports and Thesis (excluding the above)

  1. Automated Derivation of Application-aware Error Detectors, PhD Dissertation, Dept. of Computer Science, University of Illinois at Urbana-Champaign, May 2009.

  2. Ensuring Critical Data Integrity through Information Flow Signatures, William Healey, Karthik Pattabiraman, Shane Ryoo, Paul Dabrowski, Zbigniew Kalbarczyk, Ravishankar Iyer and Wen-Mei Hwu, Technical Report, Center for Reliable and High-Performance Computing, University of Illinois at Urbana-Champaign (UIUC), May 2009.

  3. Software Critical Memory: All Memory is not Created Equal, Karthik Pattabiraman, Vinod Grover and Benjamin Zorn, Microsoft Research Technical Report, December 2006.

  4. Design and Evaluation of a Power-Aware Parallel File System, Master’s Thesis, Department of Computer Science, University of Illinois at Urbana-Champaign, December 2004.

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