Author Archives: udit agarwal

Towards Reliability Assessment of Systolic Arrays against Stuck-at Faults

Udit Kumar Agarwal, Abraham Chan, Ali Asgari, and Karthik Pattabiraman. 19th IEEE Workshop on Silicon Errors in Logic – System Effects (SELSE), 2023. Received Best-of-SELSE award (one of three papers). Invited for presentation at DSN’23. [ PDF  | Presentation ] (Code)
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