Tag Archives: conference

Karthik Pattabiraman, Giacinto Paulo Saggese, Daniel Chen, Zbigniew Kalbarczyk and Ravishankar Iyer, Proceedings of the European Dependable Computing Conference (EDCC), 2006. [ PDF File | Talk ]

Abstract: This paper proposes a novel technique for preventing a wide range of data errors from corrupting the execution of applications. The proposed technique enables automated derivation of fine-grained, application-specific error detectors. An algorithm based on dynamic traces of application execution is developed for extracting the set of error detector classes, parameters, and locations in order to maximize the error detection coverage for a target application. The paper also presents an automatic framework for synthesizing the set of detectors in hardware to enable low-overhead run-time checking of the application execution. Coverage (evaluated using fault injection) of the error detectors derived using the proposed methodology, the additional hardware resources needed, and performance overhead for several benchmark programs are also reported.

This paper is super-ceded by the following journal paper.

Karthik Pattabiraman, Zbigniew Kalbarczyk and Ravishankar Iyer, Proceedings of the IEEE International Online Testing Symposium (IOLTS), 2007. [ PDF File | Talk ]

Abstract: This paper presents a technique to derive and implement error detectors to protect an application from data errors. The error detectors are derived automatically using compiler-based static analysis from the backward program slice of critical variables in the program. Critical variables are defined as those that are highly sensitive to errors, and deriving error detectors for these variables provides high coverage for errors in any data value used in the program. The error detectors take the form of checking expressions and are optimized for each control flow path followed at runtime. The derived detectors are implemented using a combination of hardware and software.Experiments show that the derived detectors incur low performance overheads while achieving high detection coverage for errors that impact the application.

This paper is superceded by the following journal paper.