Tag Archives: ML

Understanding the Resilience of Neural Network Ensembles against Faulty Training Data

Abraham Chan, Niranjhana Narayananan, Arpan Gujarati, Karthik Pattabiraman, and Sathish Gopalakrishnan, IEEE International Symposium on Quality, Reliability and Security (QRS), 2021. Full paper (Acceptance Rate: 25.1%) [ PDF | Talk | Video ] Best Paper Award (1 of 3)

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(WiP) LLTFI: Low-Level Tensor Fault Injector

Abraham Chan, Udit Agarwal, and Karthik Pattabiraman. IEEE International Workshop on Software Certification (WoSoCER’21), co-held with the IEEE International Symposium on Software Reliability Engineering (ISSRE), 2021. [ PDF | Talk ] (Code)
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Towards a safety case for hardware-fault tolerance in convolutional neural networks using activation range supervision

Florian Geissler, Syed Qutub, Sayanta Roychowdhury, Ali Asgari, Yang Peng, Akash Dhamasia, Ralf Graefe, Karthik Pattabiraman and Michael Paulitsch, AI Safety Workshop 2021, Best Paper Award Nominee (1 of 4) [ PDF | Talk ] (arXIV)
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