Shabnam Mirshokraie, Ali Mesbah and Karthik Pattabiraman, IEEE Transactions on Software Engineering (TSE), May 2015. [PDF File].
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Layali Rashid, Karthik Pattabiraman and Sathish Gopalakrishnan, IEEE Transactions on Reliability (TR), In Press (Accepted: May 2014). [ PDF ]
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Cole Schlesinger, Karthik Pattabiraman, Nikhil Swamy, David Walker and Benjamin Zorn, Journal of Computer Security (JCS), November 2014 (Invited as one of the best papers of the CSF 2011 Conference) [ PDF ]
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Comments Off on Modular Protections Against Non-Control Data Attacks
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Tagged 2014, critical data, journal, security
Karthik Pattabiraman, Nithin Nakka, Zbigniew Kalbarczyk and Ravishankar Iyer, To appear in the IEEE Transactions on Computers (TC). November 2013. [PDF file].
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Comments Off on SymPLFIED: Symbolic Program Level Fault Injection and Error Detection Framework
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Tagged 2012, formal, journal, reliability
Paruj Ratanaworabhan, Martin Burtscher, Darko Kirovski, Benjamin Zorn, Rahul Nagpal and Karthik Pattabiraman, To appear in the IEEE Transactions on Computers (TC). Accepted in January 2011. [ PDF File (Pre-print version) ]
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Comments Off on Efficient Runtime Detection and Toleration of Asymmetric Races
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Tagged 2011, journal, race, reliability
Karthik Pattabiraman, Giacinto Paulo Saggese, Daniel Chen, Zbigniew Kalbarczyk and Ravishankar Iyer, IEEE Transactions on Dependable and Secure Computing (TDSC) Vol 8., Issue 5, Sept/Oct 2011 . [ PDF File ]
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Comments Off on Automated Derivation of Application-specific Error Detectors Using Dynamic Analysis
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Tagged 2010, detectors, journal, reliability
Ravishankar Iyer, Zbigniew Kalbarczyk, Karthik Pattabiraman, William Healey, Wen-Mei Hwu, Peter Klemperer and Reza Farivar, IEEE Security and Privacy Magazine, January 2007 (Invited). [ PDF File ]
No abstract is available.
Here is a news article in the Chicago Tribune that describes this work.
Karthik Pattabiraman, Zbigniew Kalbarczyk and Ravishankar Iyer. To appear in the Proceedings of the IEEE Transactions on Dependable and Secure Computing (TDSC). (Accepted on May 1, 2009). [ PDF File ]
Comments Off on Automated Derivation of Application-aware Error Detectors using Static Analysis: The Trusted Illiac Approach
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Tagged 2009, detectors, journal, reliability, Trusted Illiac
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email: karthikp@ece.ubc.ca Phone: 604-827-4245 (please email first)Address: Rm. 4048, Fred Kaiser Building, 2332 Main Mall, Vancouver, BC V6T1Z4. |