Layali Rashid, Karthik Pattabiraman and Sathish Gopalakrishnan, IEEE Transactions on Reliability (TR), In Press (Accepted: May 2014). [ PDF ]
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Majid Dadashi, Layali Rashid, Karthik Pattabiraman and Sathish Gopalakrishnan, To appear in the Proceedings of the IEEE/IFIP International Conference on Dependable Systems and Networks (DSN), 2014. (Accept Rate: 30%)[ PDF | Talk ]
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Tagged 2014, conference, Layali, Majid, reliability, Resilient
Majid Dadashi, Layali Rashid and Karthik Pattabiraman, Poster presentation at the 9th Workshop on Silicon Errors in Logic – System Effects (SELSE), 2013. [PDF file]
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Layali Rashid, Karthik Pattabiraman and Sathish Gopalakrishnan, To appear in the Proceedings of the International Conference on the Quantitative Evaluation of Systems (QEST), 2012.
[ PDF file | Talk ]
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Tagged 2012, conference, Layali, reliability, Resilient
Layali Rashid, Karthik Pattabiraman and Sathish Gopalakrishnan, Proceedings of the IEEE Workshop on Silicon Errors in Logic, System Effects (SELSE), 2012. [ PDF File | Talk ]
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Jiesheng Wei, Layali Rashid, Karthik Pattabiraman and Sathish Gopalakrishnan, Workshop on Dependable and Secure Nano-Systems (WDSN), 2011. [ PDF File | Talk ]
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Layali Rashid, Karthik Pattabiraman and Sathish Gopalakrishnan, To appear in the Proceedings of the IEEE Pacific Rim International Symposium on Dependable Computing (PRDC), Tokyo, Japan, 2010. [ PDF file | Talk ]
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Tagged 2010, conference, Layali, reliability, Resilient
Layali Rashid, Karthik Pattabiraman and Sathish Gopalakrishnan, Workshop on Silicon Errors in Logic, System Effects (SELSE), 2010. [ PDF File ][ Talk Slides ]
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Layali Rashid, Karthik Pattabiraman and Sathish Gopalakrishnan, Proceedings of the IEEE International Workshop on Dependable and Secure Nano-computing (WDSN), 2010. [ PDF File | Talk ]
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email: karthikp@ece.ubc.ca Phone: 604-827-4245 (please email first)Address: Rm. 4048, Fred Kaiser Building, 2332 Main Mall, Vancouver, BC V6T1Z4. |