Xin Chen, Charng-da Lu and Karthik Pattabiraman, Proceedings of the IEEE Workshop on Reliability and Security Data Analysis, 2013. [ PDF File | Talk ]
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Anna Thomas and Karthik Pattabiraman, Workshop on Silicon Errors in Logic – System Effects (SELSE), 2013. [ PDF | Talk ] (NOTE: SELSE does not have a formal proceedings).
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Bo Fang, Jiesheng Wei, Karthik Pattabiraman and Matei Ripeanu,
Workshop on Error Resilient Architectures (WRA), held in conjunction with Micro 2012. [ PDF File | Talk Slides ]
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Farid M. Tabrizi and Karthik Pattabiraman, To appear in the Workshop on Recent Advances in Intrusion Tolerance and reSilience (WRAITS), 2012.
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Jiesheng Wei and Karthik Pattabiraman, Proceedings of the IEEE Workshop on Silicon Errors in Logic, System Effects (SELSE), 2012. [ PDF File | Talk ]
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Layali Rashid, Karthik Pattabiraman and Sathish Gopalakrishnan, Proceedings of the IEEE Workshop on Silicon Errors in Logic, System Effects (SELSE), 2012. [ PDF File | Talk ]
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Jiesheng Wei, Layali Rashid, Karthik Pattabiraman and Sathish Gopalakrishnan, Workshop on Dependable and Secure Nano-Systems (WDSN), 2011. [ PDF File | Talk ]
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Layali Rashid, Karthik Pattabiraman and Sathish Gopalakrishnan, Workshop on Silicon Errors in Logic, System Effects (SELSE), 2010. [ PDF File ][ Talk Slides ]
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Layali Rashid, Karthik Pattabiraman and Sathish Gopalakrishnan, Proceedings of the IEEE International Workshop on Dependable and Secure Nano-computing (WDSN), 2010. [ PDF File | Talk ]
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Karthik Pattabiraman, Giacinto Paolo Saggese, Daniel Chen, Zbigniew Kalbarczyk and Ravishankar Iyer, Workshop on Reliability Issues in High-Performance Computing (HPCRI), 2006.
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Super-ceded by the following conference paper.
Abstract: This paper proposes a novel technique for automated derivation of fine-grained, application-specific error detectors. An algorithm based on dynamic traces of application execution is developed for extracting the optimal set of error detectors for a target application. An automatic framework is proposed for synthesizing the derived detectors in hardware and enabling low-overhead run-time checking of the application execution. Coverage (evaluated using fault injection) of the error detectors obtained using the proposed methodology, the additional hardware resources, and performance overhead for several benchmark programs are also reported.
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Posted in papers
Tagged 2006, detectors, reliability, workshop
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email: karthikp@ece.ubc.ca Phone: 604-827-4245 (please email first)Address: Rm. 4048, Fred Kaiser Building, 2332 Main Mall, Vancouver, BC V6T1Z4. |